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Defect characterization of erbium doped silicon light emitting diodes

dc.contributor.advisorLionel C. Kimerling.en_US
dc.contributor.authorGupta, Rita, 1970-en_US
dc.date.accessioned2005-08-16T23:42:27Z
dc.date.available2005-08-16T23:42:27Z
dc.date.copyright1994en_US
dc.date.issued1994en_US
dc.identifier.urihttp://hdl.handle.net.ezproxyberklee.flo.org/1721.1/11695
dc.descriptionThesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1994.en_US
dc.descriptionIncludes bibliographical references (leaves 86-88).en_US
dc.description.statementofresponsibilityby Rita Gupta.en_US
dc.format.extent88 leavesen_US
dc.format.extent6248000 bytes
dc.format.extent6247760 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu.ezproxyberklee.flo.org/handle/1721.1/7582
dc.subjectMaterials Science and Engineeringen_US
dc.titleDefect characterization of erbium doped silicon light emitting diodesen_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineering
dc.identifier.oclc32281241en_US


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